Technologies for the optical characterization of materials at terahertz frequencies

The noncontact measurement of material properties using light is used in a wide variety of applications, from airport security scanners to medical x-ray imaging and various analytical techniques. Some of the most interesting information is contained in what is known as the terahertz region of the frequency spectrum, but developing broadband spectroscopic techniques for the terahertz regime has proved difficult. Masatsugu Yamashita, Chiko Otani and colleagues from the RIKEN Center for Advanced Photonics and Canon Inc. have now developed a spectroscopy system that operates across an unprecedented range of terahertz and infrared frequencies.

from Phys.org: Physics News http://ift.tt/1qTSCTf

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